High Resolution Transmission Electron Microscopy

Instrument model:JEM-2100F

Manufacture:JEOL

Technical Specifications:

Spot Resolution：0.19nm；Line Resolution：0.14nm；

STEM (HAADF) Resolution：0.20nm

Minimum Beam Spot：0.2nm

Maximum Inclination Angle of Sample Holder (X、Y): ±25°

EDAX Energy Disperse Spectroscopy (EDS)：5B ~ 92U

Main Function and Application:

It is mainly used for the analysis and research of the microstructure and composition of inorganic materials. The functions of the instrument include: Electron Diffraction：Selected Area Diffraction（SAD）、Concentrated Beam Diffraction（CBD）、Nano Beam Diffraction（NBD）. Image：Diffraction Contrast Image（Bright Field Image、Dark Field Image）、High Resolution Image、Scan Transmission Image (Bright Field Image、High Angle Annular Dark Field Image).EDS：Spot、Line and Mapping .

TEL:021-69580140-606